Silicon on Insulator CMOS Technology
![Silicon on Insulator CMOS Technology_1](https://aerospace.honeywell.com/content/dam/aerobt/en/images/learn/products/sensors/horizontal/AeroBT-s_704961016_manufactoring-sensors_2880x1440.jpg)
- Low leakage current to substrate enables greatly improved circuit operation to 225°C continuous and excursions to 300°C
- Reduced capacitance for faster and lower power circuits
- Greatly reduced noise with isolation from the bulk silicon for sensitive mixed signal circuits
- Designing in reliability by establishing electrical rules based on wear out mechanism characterization performed on specially designed test structures (electromigration, time dependent dielectric breakdown (TDDB), hot carriers, negative bias temperature instability, radiation)
- Utilizing a structured and controlled design process
- A statistically controlled wafer fabrication process with a continuous defect reduction process
- Individual wafer lot acceptance through process monitor testing
- The use of characterized and qualified packages and assembly methods all parts are burned in at 250°C